Topology-Driven Neural Defect Pattern Discovery in Silicon Wafers. The American Journal of Analytics and Artificial Intelligence (AJAAI), [S. l.], v. 2, n. 03, 2024. DOI: 10.5281/zenodo.20591504. Disponível em: https://ajaaai.org/index.php/ajaai/article/view/4. Acesso em: 24 jul. 2026.